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22nd International Mixed-Signal
Testing Workshop |
Submission deadline: March
17, 2017
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CALL FOR PAPERS
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The International Mixed-Signals Testing Workshop is a forum that brings together this community to discuss ideas and views on the following topics, among others:
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Submissions should be via the workshop web-site and consist of either an extended summary of at least 750 words or preferably a complete 6-page paper. The workshop will produce electronic formal proceedings with an ISBN number which will become available in the IEEE Xplore digital library. A selection of papers will be invited to a special issue of Elsevier Journal of Electronic Testing: Theory and Applications (JETTA). All submissions are to be made
electronically through the submission Web site: Notice that only submissions of PDFs are allowed.
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Submission deadline: March 17, 2017 Notification of acceptance: April 3, 2017 Camera-ready full paper: May 8, 2017 |
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Additional Information | |
For second consecutive year IMSTW'17 will be held as part of the Federative Event on Design for Robustness (FEDfRo). With a single registration, attendees will be able to access the sessions of three events: IOLTS: International Symposium on On-Line Testing and Robust System Design IMSTW: the International Mixed-Signal Testing Workshop IVSW: the International Verification and Security Workshop For all details about the organization of these joint events please visit: http://tima.imag.fr/conferences/fedfro/fedfro17/ |
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Committee | |
General Chair Gildas Leger, IMSE-CNM, Spain Program Chairs Manuel Barragan, TIMA, France Ke Huang, SDSU, USA Program Committee (TBC) Josep Altet Luz Balado Ian Bell Abhijit Chatterjee Mariane Comte Oren Eliezer Antonio Gines Joao Goes Nuno Horta Jiun-Lang Huang Vincent Kerzerho Haruo Kobayashi Jose Machado Da Silva Yiorgos Makris Linda Milor Salvador Mir Suriya Natarajan Sebastian Sattler Mustapha Slamani Haralampos Stratigopoulos Stephen Sunter Friedrich Taenzler Yiorgos Tsiatouhas Diego Vazquez William Eisenstadt Serge Bernard Marie-Minerve Louerat Shreyas Sen MarkPo-Hung Lin Shane Rowling |
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For more information, visit
us on the web at: http://tima.imag.fr/conferences/imstw/imstw17/
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The CONFERENCE is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE Computer Society- Test
Technology Technical Council
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